and a third device which does measuring to the thickness of the photoresistor of the wafer arranged on the sucking disc (2).
以及第三装置(5),对安装在吸盘(2)上光敏电阻厚度进测定。
and a third device which does measuring to the thickness of the photoresistor of the wafer arranged on the sucking disc (2).
以及第三装置(5),对安装在吸盘(2)上光敏电阻厚度进测定。
声明:以上例句、词类均由互联网资源自动生成,部未经过人工审核,其表达内容亦不代表本软件观点;若发现问题,欢迎向我们指正。