We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分涉计量的原,仅用幅光载频涉条纹图获取全部位相信息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分涉计量的原,仅用幅光载频涉条纹图获取全部位相信息。
The principle and structure of laser shearography and electronic speckle interferometry were introduced.Speckle pattern was disposed and analysed.
摘要介绍了研制的激光电子剪切散斑涉成系统的原及结构组成,对散斑图进行了图分析。
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