We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分干的原理,仅用一幅光载干条纹图获取全部息。
We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram.
叙述了次条纹积分干的原理,仅用一幅光载干条纹图获取全部息。
声明:以上例句、词性分类均由互联网资源自动生成,部分未经过人工审核,其表达内容亦不代表本软件的观点;若发现问题,欢迎向我们指正。