How to perform the SOC test with reduction the development cycle time and production cost without scarifying the performance is the challenge confronted by design engineer and test engineer.
如何在缩短
周期、降低芯
成本
损失芯性能的前提下
成SOC系统芯的测试是芯工程师和测试工程师当前所要面对的挑战。
代表本软件的观点；若发现问题，欢迎向我们指正。
